Group meeting May, 19

During group meeting mgr inż. Paulina Szymanowska presented her latest research results with elechtrochemical impedance spectroscopy setup for microbiological experiments.Read more …

March, 22

Mgr inż. Magdalena Moczała presented a summary of her work and defended her PhD thesis „Metrologia zmian masy z zastosowaniem układów MEMS" (Metrology of mass changes using MEMS devices).  Dissertation was reviewed by dr hab. inż. Marcin Janicki from Łódź University of Technology and dr hab. inż. Mateusz Śmietana from Warsaw University of Technology.Read more …

Meeting Feb, 21

During group meeting mgr inż. Maciej Rudek presented talk "Postępy mikroskopii termicznej". Results obtained with LoFM (Load Force Modulation) method were presented. LoFM method is a new feature developed for the ARM Scanner controller for the Drobnowidz series AFM, which is being developed in our group.Read more …

Meeting Feb, 9 – Guest lecture

Profesor Paolo di Barba from University of Pavia visited Division of Nanometrology at the beginning of February. We had opportunity to confront different points of view on MEMS devices. Our experimental results were discussed with an expert in the field of numerical modelling of such devices. During  group meeting Profesor di Barba also presented talk "Evolutionary Computing, Field Analysis and Optimal Design of MEMS devices".  Read more …

Meeting Jan, 27

During Division of Nanometrology meeting dr inż. Jarosław Serafińczuk presented talk "Zastosowanie dyfrakcji rentgenowskiej prowadzonej od krawędzi próbki w badaniach materiałowych" (X-Ray diffraction performed on the edge of the sample and its applications).Read more …

Group meeting

During group meeting mgr inż. Wojciech Majstrzyk presented talk "Działanie, różnice i możliwości dźwigni MEMSaktuowanych elektromagnetyczne: metalizowanych i domieszkowanych". Today our meeting was attended by our guests from Institute of Engineering Materials and Biomaterials, Faculty of Mechanical Engineering, Silesian University of Technology.  Read more …