Maciej Rudek presents a talk at faculty seminar

Today our PhD student Maciej Rudek presented talk on the faculty seminar“Zastosowania mikroskopii bliskich oddziaływań w metrologii układów klasy„BEYOND CMOS” i „MORE THAN MOORE” ” / Application of scanning probe microscopy in a metrology of „BEYOND CMOS” & „MORE THAN MOORE” class devices / which summarised his latest research activity.