Congratulations to Michał Świątkowski and co-authors for publication in Measurement Science and Technology(IF=1,6) wydawnictwa IOPScience:

M. Świątkowski , A. Wojtuś, G. Wielgoszewski, M. Rudek, T. Piasecki, G. Jóźwiak and T. Gotszalk

A low-noise measurement system for scanning thermal microscopy resistive nanoprobes based on a transformer ratio-arm bridge

DOI: 10.1088/1361-6501/aa9d10